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Journal of Electronic Testing, Volume 40
Volume 40, Number 1, February 2024
- Vishwani D. Agrawal:
Editorial. 1-2 - 2023 JETTA Reviewers. 3-4
- Yuling Shang, Songyi Wei, Chunquan Li
, Xiaojing Ye, Lizhen Zeng, Wei Hu, Xiang He, Jinzhuo Zhou:
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis. 5-18 - Zhengfeng Huang, Zishuai Li
, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan:
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. 19-30 - Shun-Hua Yang, Shi-Yu Huang
:
General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting Scheme. 31-43 - Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang:
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches. 45-60 - M. N. Saranya
, Rathnamala Rao:
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems. 61-74 - Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. 75-86 - Chen Dong
, Xiao Chen, Zhenyi Chen:
Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees. 87-99 - Linsen Huang:
Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration. 101-106 - Shifeng Yu
, Junjie Dai, Junhui Li:
Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration. 107-116 - Hala Ibrahim, Haytham Azmi, M. Watheq El-Kharashi
, Mona Safar:
Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach. 117-135
Volume 40, Number 2, April 2024
- Vishwani D. Agrawal:
Editorial. 137-138 - Soham Roy
, Spencer K. Millican, Vishwani D. Agrawal:
A Survey and Recent Advances: Machine Intelligence in Electronic Testing. 139-158 - Baojun Liu
, Li Cai, Chuang Li:
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET. 159-169 - Rachana Ahirwar, Manisha Pattanaik, Pankaj Srivastava:
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application. 171-184 - Rongxing Cao
, Yan Liu, Yulong Cai, Bo Mei, Lin Zhao, Jiayu Tian, Shuai Cui, He Lv, Xianghua Zeng, Yuxiong Xue:
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission. 185-197 - Alberto Bosio
, Samuele Germiniani
, Graziano Pravadelli
, Marcello Traiola
:
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs. 199-214 - Josie E. Rodriguez Condia
, Juan-David Guerrero-Balaguera
, Edward Javier Patiño Nuñez, Robert Limas Sierra
, Matteo Sonza Reorda
:
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs. 215-228 - Bahman Arasteh
, Sahar Golshan, Shiva Shami, Farzad Kiani:
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm. 229-243 - Thiago Santos Copetti
, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls:
A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. 245-257 - Bokka Raveendranadh, Sadasivam Tamilselvan:
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network Performance. 259-273 - Ching-Yi Wen, Shi-Yu Huang
:
Instant Test and Repair for TSVs using Differential Signaling. 275-287
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