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ORCIDInternational Symposium on VLSI Design, Automation and Test (VLSI-DAT)
VLSI-DAT 2022: Hsinchu, Taiwan
- 2022 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2022, Hsinchu, Taiwan, April 18-21, 2022. IEEE 2022, ISBN 978-1-6654-0921-6 [contents]
VLSI-DAT 2021: Hsinchu, Taiwan
- International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021. IEEE 2021, ISBN 978-1-6654-1915-4 [contents]
VLSI-DAT 2020: Hsinchu, Taiwan
- 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, Hsinchu, Taiwan, August 10-13, 2020. IEEE 2020, ISBN 978-1-7281-6083-2 [contents]
VLSI-DAT 2019: Hsinchu, Taiwan
- International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019, Hsinchu, Taiwan, April 22-25, 2019. IEEE 2019, ISBN 978-1-7281-0655-7 [contents]
VLSI-DAT 2018: Hsinchu, Taiwan
- 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. IEEE 2018, ISBN 978-1-5386-4260-3 [contents]
VLSI-DAT 2017: Hsinchu, Taiwan
- 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. IEEE 2017, ISBN 978-1-5090-3969-2 [contents]
VLSI-DAT 2015: Hsinchu, Taiwan
- VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. IEEE 2015, ISBN 978-1-4799-6275-4 [contents]
VLSI-DAT 2014: Hsinchu, Taiwan
- Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014. IEEE 2014 [contents]
VLSI-DAT 2013: Hsinchu, Taiwan
- 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. IEEE 2013, ISBN 978-1-4673-4435-7 [contents]
VLSI-DAT 2012: Hsinchu, Taiwan
- Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, VLSI-DAT 2012, Hsinchu, Taiwan, April 23-25, 2012. IEEE 2012, ISBN 978-1-4577-2080-2 [contents]
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