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ORCID8th IOLTW 2002: Isle of Bendor, France
- 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. IEEE Computer Society 2002, ISBN 0-7695-1641-6
Hardware Fault Tolerance
- Parag K. Lala, B. Kiran Kumar:
An Architecture for Self-Healing Digital Systems. 3-7 - Daniele Rossi
, Steven V. E. S. van Dijk, Richard P. Kleihorst, A. H. Nieuwland, Cecilia Metra:
Coding Scheme for Low Energy Consumption Fault-Tolerant Bus. 8-12 - Anzhela Yu. Matrosova, Valentina Andreeva, Yu. Sedov:
Survivable Discrete Circuits Design. 13-
Hardware-Software Design and Validation of Fault Tolerant Systems
- Astrit Ademaj, Petr Grillinger, Pavel Herout, Jan Hlavicka:
Fault Tolerance Evaluation Using Two Software Based Fault Injection Methods. 21-25 - Silvia Chiusano, Stefano Di Carlo, Paolo Prinetto:
Automated Synthesis of SEU Tolerant Architectures from OO Descriptions. 26-31 - Cristiana Bolchini, Luigi Pomante, Fabio Salice, Donatella Sciuto:
A System Level Approach in Designing Dual-Duplex Fault Tolerant Embedded Systems. 32-
Self Checking Circuits
- Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking Code-Disjoint Carry-Skip Adder. 39-43 - Ilya Levin, Vladimir Sinelnikov, Mark G. Karpovsky, Sergey Ostanin:
Sequential Circuits Applicable for Detecting Different Types of Faults. 44-
Concurrent Error Detection I
- Amine M'sir, Fabrice Monteiro, Abbas Dandache, Bernard Lepley:
A High Speed Encoder for Recursive Systematic Convolutive Codes. 51-55 - Y. Tsiatouhas, Angela Arapoyanni, Dimitris Nikolos, Th. Haniotakis:
A Hierarchical Architecture for Concurrent Soft Error Detection Based on Current Sensing. 56-60 - Huy Nguyen, Abhijit Chatterjee:
Design of Real-Number Checksum Codes Using Shared Partial Computation for CED in Linear DSP Systems. 61-
Concurrent Error Detection II
- Matthias Pflanz, Karsten Walther, Christian Galke, Heinrich Theodor Vierhaus:
On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check. 69-73 - Feng Gao, John P. Hayes:
On-Line Monitor Design of Finite-State Machines. 74-78 - Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin:
A Statistical Sampler for a New On-line Analog Test Method. 79-
Analog and Mixed Signal Testing and Reliability
- Joan Font, J. Ginard, Eugeni Isern, Miquel Roca, Jaume Segura, Eugenio García:
A BICS for CMOS Opamps by Monitoring the Supply Current Peak. 94-98 - Rosa Rodríguez-Montañés, D. Muñoz, Luz Balado, Joan Figueras:
Analog Switches in Programmable Analog Devices: Quiescent Defective Behaviours. 99-103
Fault Injection Techniques and Results
- Régis Leveugle, K. Hadjiat:
Multi-Level Fault Injection Experiments Based on VHDL Descriptions: A Case Study. 107-111 - Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante:
Analysis of SEU Effects in a Pipelined Processor. 112-116 - Gian Carlo Cardarilli, F. Kaddour, A. Leandri, Marco Ottavi, Salvatore Pontarelli, Raoul Velazco:
Bit Flip Injection in Processor-Based Architectures: A Case Study. 117-
BIST Techniques I
- Miron Abramovici, Charles E. Stroud:
BIST-Based Delay-Fault Testing in FPGAs. 131-134 - N. Axelos, J. Watson, D. Taylor, A. Platts:
Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing. 135-139 - Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz:
A Low Power Pseudo-Random BIST Technique. 140-
BIST Techniques II
- Ilia Polian, Bernd Becker:
Stop & Go BIST. 147-151 - Giorgos Dimitrakopoulos, Dimitris Nikolos, Dimitris Bakalis:
Bit-Serial Test Pattern Generation by an Accumulator Behaving as a Non-Linear Feedback Shift Register. 152-157 - Dimitri Kagaris:
Built-in Generation of m -Sequences with Irreducible Characteristic Polynomials. 158-
Testing Issues
- Manuel G. Gericota, Gustavo R. Alves, Miguel L. Silva, José M. Ferreira:
Active Replication: Towards a Truly SRAM-Based FPGA On-Line Concurrent Testing. 165-169 - Giuseppe Di Gregorio, Maria Grazia La Rosa, Biagio Russo:
Checkers for RF Matching Networks on an Automatic Test Board. 170-
Posters
- Carlo Dallavalle:
Adaptive IDDQ: How to Set an IDDQ Limit for any Device Under Test. 177 - Christian Galke, Matthias Pflanz, Heinrich Theodor Vierhaus:
On-line Detection and Compensation of Transient Errors in Processor Pipeline-Structures. 178 - Jose Miguel Vieira dos Santos:
Recovering Sequential Circuits from Temporary Faults: The Survival Capability of Scan-Cells. 179 - Naotake Kamiura, Kazuharu Yamato, Teijiro Isokawa, Nobuyuki Matsui:
Learning-Based On-Line Testing in Feedforward Neural Networks. 180 - Adam Kristof:
On-Line Detection of Short Circuits in Digital Devices and Systems. 183 - Mohammad A. Naal, M. Rakotoar, Emmanuel Simeu, Chouki Aktouf:
Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach. 184 - Petros Oikonomakos, Mark Zwolinski:
Transformation Based Insertion of On-Line Testing Resources in a High-Level Synthesis Environment. 185 - Aleksandra Rankov, Gaynor E. Taylor, John Webster:
Robust Data Compression for Analogue Test Outputs. 186 - Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.:
A New On-Line Robust Approach to Design Noise Immune Speech Recognition Systems. 187 - Ari Virtanen:
Radiation Effects Facility RADEF. 188 - Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker:
Sequential n -Detection Criteria: Keep It Simple. 189 - Chouki Aktouf, Benoît Pannetier, Pierre Lemaître-Auger, Smail Tedjini:
On-line Testing of Embedded Systems Using Optical Probes: System Modeling and Probing Technology. 191 - Bartomeu Alorda, André Ivanov, Jaume Segura:
An Off-Chip Sensor Circuit for On-Line Transient Current Testing. 192 - Luis Berrojo, Isabel González, Luis Entrena, Celia López, Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero:
Analysis of the Equivalences and Dominances of Transient Faults at the RT Level. 193 - Fernanda Gusmão de Lima Kastensmidt, Luigi Carro, Raoul Velazco, Ricardo Augusto da Luz Reis:
Injecting Multiple Upsets in a SEU Tolerant 8051 Micro-Controller. 194 - F. Kaddour, Sana Rezgui, Raoul Velazco, S. Rodriguez, J. R. De Mingo:
Error Rate Estimation for a Flight Application Using the CEU Fault Injection Approach. 195
Memory BIST Analysis and Application
- Alvin Jee:
Defect-Oriented Analysis of Memory BIST Tests. 201-205 - Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda:
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. 206-210 - Farzin Karimi, Fabrizio Lombardi:
A Scan-Bist Environment for Testing Embedded Memories. 211-
Memory ECC and Soft Errors
- Daniele Rossi, Cecilia Metra, Bruno Riccò:
Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories. 221-225 - Bernard Coloma, Patrick Delaunay, Olivier Husson:
High Speed 15 ns 4 Mbits SRAM for Space Application. 226-
High Reliability in Railway and Automotive Systems
- D. Bied-Charreton, D. Guillon, B. Jacques:
The YATE Fail-Safe Interface: The User's Point of View. 233- - Alberto Manzone, Diego De Costantini:
Fault Tolerant Insertion and Verification: A Case Study. 238-242 - Luca Schiano, Cecilia Metra, Diego Marino:
Design and Implementation of a Self-Checking Scheme for Railway Trackside Systems. 243-
Embedded Memory Yield Enhancement
- Emmanuel Rondey, Yann Tellier, Simone Borri:
A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios. 251-255 - Valery A. Vardanian, Yervant Zorian:
A March-Based Fault Location Algorithm for Static Random Access Memories. 256-261 - Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu:
A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories. 262-
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