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"Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and ..."

N. Axelos et al. (2002)

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DOI: 10.1109/OLT.2002.1030196

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/iolts/AxelosWTP02
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/AxelosWTP02
N. Axelos, J. Watson, D. Taylor, A. Platts:
Built-In-Self-Test of Analogue Circuits Using Optimised Fault Sets and Transient Response Testing. IOLTW 2002: 135-139

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