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Publication search results
found 45 matches
- 1995
- Eric Adler, John K. DeBrosse, Stephen F. Geissler, Steven J. Holmes, Mark D. Jaffe, Jeffrey B. Johnson, Charles W. Koburger III, Jerome B. Lasky, Brian Lloyd, Glen L. Miles, James S. Nakos, Wendell P. Noble Jr., Steven H. Voldman, Michael Armacost, Richard Ferguson:
The evolution of IBM CMOS DRAM technology. IBM J. Res. Dev. 39(1-2): 167-188 (1995) - Ramesh C. Agarwal, Susanne M. Balle, Fred G. Gustavson, Mahesh V. Joshi, Prasad V. Palkar:
A three-dimensional approach to parallel matrix multiplication. IBM J. Res. Dev. 39(5): 575-582 (1995) - Phaedon Avouris, In-Whan Lyo, Yukio Hasegawa:
Probing electrical transport, electron interference, and quantum size effects at surfaces with STM/STS. IBM J. Res. Dev. 39(6): 603-616 (1995) - Roland A. Bechade, Robert M. Houle:
Digital delay line clock shapers and multipliers. IBM J. Res. Dev. 39(1-2): 93-104 (1995) - Reinaldo A. Bergamaschi, Richard A. O'Connor, Leon Stok, Michael Z. Moricz, Shiv Prakash, Andreas Kuehlmann, D. Sreenivasa Rao:
High-level synthesis in an industrial environment. IBM J. Res. Dev. 39(1-2): 131-148 (1995) - Kerry Bernstein, John E. Bertsch, Lawrence G. Heller, Edward J. Nowak, Francis R. White:
Reduced-voltage power/performance optimization of the 3.6-volt PowerPC 601 Microprocessor. IBM J. Res. Dev. 39(1-2): 33-42 (1995) - Pradip Bose, S. Surya:
Architectural timing verification of CMOS RISC processors. IBM J. Res. Dev. 39(1-2): 113-130 (1995) - David D. Chambliss, Robert J. Wilson, Shirley Chiang:
The use of STM to study metal film epitaxy. IBM J. Res. Dev. 39(6): 639-654 (1995) - Donald G. Chesebro, James W. Adkisson, Lyman R. Clark, Steven N. Eslinger, Margaret A. Faucher, Steven J. Holmes, Raymond P. Mallette, Edward J. Nowak, Edward W. Sengle, Steven H. Voldman, Thomas W. Weeks:
Overview of gate linewidth control in the manufacture of CMOS logic chips. IBM J. Res. Dev. 39(1-2): 189-200 (1995) - Donna R. Cote, Son Van Nguyen, William J. Cote, Scott L. Pennington, Anthony K. Stamper, Dragan V. Podlesnik:
Low-temperature chemical vapor deposition processes and dielectrics for microelectronic circuit manufacturing at IBM. IBM J. Res. Dev. 39(4): 437-464 (1995) - Alina Deutsch, Gerard V. Kopcsay, Christopher W. Surovic, Barry J. Rubin, Lewis M. Terman, Richard P. Dunne Jr., Thomas A. Gallo, Robert H. Dennard:
Modeling and characterization of long on-chip interconnections for high-performance microprocessors. IBM J. Res. Dev. 39(5): 547-568 (1995) - Sang H. Dhong, Masahiro Tanaka, Steven W. Tomashot, Toshiaki Kirihata:
A low-noise TTL-compatible CMOS off-chip driver circuit. IBM J. Res. Dev. 39(1-2): 105-112 (1995) - Daniel C. Edelstein, George A. Sai-Halasz, Yuh-Jier Mii:
VLSI on-chip interconnection performance simulations and measurements. IBM J. Res. Dev. 39(4): 383-402 (1995) - Wayne F. Ellis, John E. Barth Jr., Sri Divakaruni, Jeffrey H. Dreibelbis, Anatol Furman, Erik L. Hedberg, Hsing-San Lee, Thomas M. Maffitt, Christopher P. Miller, Charles H. Stapper, Howard L. Kalter:
Multipurpose DRAM architecture for optimal power, performance, and product flexibility. IBM J. Res. Dev. 39(1-2): 51-62 (1995) - John F. Ewen, Mehmet Soyuer, Albert X. Widmer, Kevin R. Wrenner, Benjamin D. Parker, Herschel A. Ainspan:
CMOS circuits for Gb/s serial data communication. IBM J. Res. Dev. 39(1-2): 73-82 (1995) - Daniel J. Fleming:
Preface. IBM J. Res. Dev. 39(1-2): 3-4 (1995) - Peter A. Franaszek, Randolph D. Nelson:
Properties of delay-cost scheduling in time-sharing systems. IBM J. Res. Dev. 39(3): 295-314 (1995) - Chao-Kun Hu, Kenneth P. Rodbell, Timothy D. Sullivan, Kim Y. Lee, Dennis P. Bouldin:
Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines. IBM J. Res. Dev. 39(4): 465-498 (1995) - John R. Kirtley, Mark B. Ketchen, Chang C. Tsuei, Jonathan Z. Sun, William J. Gallagher, Lock See Yu-Jahnes, Arunava Gupta, Kevin G. Stawiasz, Shalom J. Wind:
Design and applications of a scanning SQUID microscope. IBM J. Res. Dev. 39(6): 655-668 (1995) - Charles W. Koburger III, William F. Clark, James W. Adkisson, Eric Adler, Paul E. Bakeman, Albert S. Bergendahl, Alan B. Botula, W. Chang, Bijan Davari, John H. Givens, Howard H. Hansen, Steven J. Holmes, David V. Horak, Chung Hon Lam, Jerome B. Lasky, Stephen E. Luce, Randy W. Mann, Glen L. Miles, James S. Nakos, Edward J. Nowak, Ghavam G. Shahidi, Yuan Taur, Francis R. White, Matthew R. Wordeman:
A half-micron CMOS logic generation. IBM J. Res. Dev. 39(1-2): 215-228 (1995) - T. S. Kuan:
Preface. IBM J. Res. Dev. 39(4): 370 (1995) - Daniel M. Kuchta, Herschel A. Ainspan, Frank J. Canora, Richard P. Schneider Jr.:
Performance of fiber-optic data links using 670-nm cw VCSELs and a monolithic Si photodetector and CMOS preamplifier. IBM J. Res. Dev. 39(1-2): 63-72 (1995) - Andreas Kuehlmann, Arvind Srinivasan, David P. LaPotin:
Verity - A formal verification program for custom CMOS circuits. IBM J. Res. Dev. 39(1-2): 149-166 (1995) - Jeffrey C. Lagarias, Charles Philippe Tresser:
A walk along the branches of the extended Farey Tree. IBM J. Res. Dev. 39(3): 283-294 (1995) - George A. Leonovich, Anthony P. Franchino, William J. Miller, Uh-Po Eric Tsou:
Integrated cost and productivity learning in CMOS semiconductor manufacturing. IBM J. Res. Dev. 39(1-2): 201-214 (1995) - Thomas J. Licata, Evan G. Colgan, James M. E. Harper, Stephen E. Luce:
Interconnect fabrication processes and the development of low-cost wiring for CMOS products. IBM J. Res. Dev. 39(4): 419-436 (1995) - Martin A. Lutz, Randall M. Feenstra, Jack O. Chu:
Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures. IBM J. Res. Dev. 39(6): 629-638 (1995) - H. Jonathon Mamin, Bruce D. Terris, Long-Sheng Fan, Storrs Hoen, Robert C. Barrett, Daniel Rugar:
High-density data storage using proximal probe techniques. IBM J. Res. Dev. 39(6): 681-700 (1995) - Randy W. Mann, Larry A. Clevenger, Paul D. Agnello, Francis R. White:
Silicides and local interconnections for high-performance VLSI applications. IBM J. Res. Dev. 39(4): 403-418 (1995) - C. Mathew Mate:
Force microscopy studies of the molecular origins of friction and lubrication. IBM J. Res. Dev. 39(6): 617-628 (1995)
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retrieved on 2024-06-03 07:55 CEST from data curated by the dblp team
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