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Publication search results
found 83 matches
- 2006
- Julio Pérez Acle, Matteo Sonza Reorda, Massimo Violante:
Early, Accurate Dependability Analysis of CAN-Based Networked Systems. IEEE Des. Test Comput. 23(1): 38-45 (2006) - Nisar Ahmed, Mohammad Tehranipoor:
Improving Transition Delay Test Using a Hybrid Method. IEEE Des. Test Comput. 23(5): 402-412 (2006) - Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda:
System-in-Package Testing: Problems and Solutions. IEEE Des. Test Comput. 23(3): 203-211 (2006) - Brian Bailey:
Was it worth the wait? Yes! IEEE Des. Test Comput. 23(2): 160-161 (2006) - Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh:
Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. IEEE Des. Test Comput. 23(2): 110-116 (2006) - Victor Berman:
Standards: The P1685 IP-XACT IP Metadata Standard. IEEE Des. Test Comput. 23(4): 316-317 (2006) - Victor Berman:
Standards: DASC sees moves toward formality in design. IEEE Des. Test Comput. 23(5): 428-429 (2006) - Soumendu Bhattacharya, Abhijit Chatterjee:
A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Des. Test Comput. 23(6): 464-475 (2006) - Sounil Biswas, Ronald D. Blanton:
Statistical Test Compaction Using Binary Decision Trees. IEEE Des. Test Comput. 23(6): 452-462 (2006) - Shekhar Borkar:
Tackling variability and reliability challenges. IEEE Des. Test Comput. 23(6): 520 (2006) - Sebastià A. Bota, José Luis Rosselló, Carol de Benito, Ali Keshavarzi, Jaume Segura:
Impact of Thermal Gradients on Clock Skew and Testing. IEEE Des. Test Comput. 23(5): 414-424 (2006) - Thomas Brandtner:
Chip-Package Codesign Flow for Mixed-Signal SiP Designs. IEEE Des. Test Comput. 23(3): 196-202 (2006) - Ken Butler:
Conference Reports: 2005 International Test Conference. IEEE Des. Test Comput. 23(1): 71 (2006) - Kenneth M. Butler:
Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Des. Test Comput. 23(5): 388-389 (2006) - John M. Carulli Jr., Thomas J. Anderson:
The Impact of Multiple Failure Modes on Estimating Product Field Reliability. IEEE Des. Test Comput. 23(2): 118-126 (2006) - Kwang-Ting Cheng:
New beginnings, continued success. IEEE Des. Test Comput. 23(1): 5-6 (2006) - Kwang-Ting (Tim) Cheng:
Dealing with early life failures. IEEE Des. Test Comput. 23(2): 85 (2006) - Kwang-Ting (Tim) Cheng:
The Need for a SiP Design and Test Infrastructure. IEEE Des. Test Comput. 23(3): 181 (2006) - Kwang-Ting (Tim) Cheng:
Vision from the Top. IEEE Des. Test Comput. 23(4): 261 (2006) - Kwang-Ting (Tim) Cheng:
The New World of ESL Design. IEEE Des. Test Comput. 23(5): 333 (2006) - Kwang-Ting (Tim) Cheng:
Handling variations and uncertainties. IEEE Des. Test Comput. 23(6): 434 (2006) - Jérôme Chevalier, Maxime de Nanclas, Luc Filion, Olivier Benny, Mathieu Rondonneau, Guy Bois, El Mostapha Aboulhamid:
A SystemC Refinement Methodology for Embedded Software. IEEE Des. Test Comput. 23(2): 148-158 (2006) - Scott Davidson:
Searching for clues: Diagnosing IC failures. IEEE Des. Test Comput. 23(1): 67-68 (2006) - Scott Davidson:
All about getting it. IEEE Des. Test Comput. 23(1): 80 (2006) - Scott Davidson:
An insider's look at microprocessor design. IEEE Des. Test Comput. 23(2): 162-163 (2006) - Scott Davidson:
Who Reads This Stuff Anyway? IEEE Des. Test Comput. 23(4): 328 (2006) - Scott Davidson:
Book Reviews: A Comprehensive EDA Handbook. IEEE Des. Test Comput. 23(5): 426-427 (2006) - Douglas Densmore, Roberto Passerone:
A Platform-Based Taxonomy for ESL Design. IEEE Des. Test Comput. 23(5): 359-374 (2006) - Stephen A. Edwards:
The Challenges of Synthesizing Hardware from C-Like Languages. IEEE Des. Test Comput. 23(5): 375-386 (2006) - Eric S. Fetzer:
Using Adaptive Circuits to Mitigate Process Variations in a Microprocessor Design. IEEE Des. Test Comput. 23(6): 476-483 (2006)
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