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Publication search results
found 50 matches
- 2018
- Sohrab Aftabjahani, Jason Oberg, Michael Chen, Huawei Li:
Innovative practices on challenges, opportunities, and solutions to hardware security. VTS 2018: 1 - Koji Asami, Yoshiro Tamura, Haruo Kobayashi, Jun Matsushima, Yoichi Maeda, Kazumi Hatayama:
Innovative practices on test in Japan. VTS 2018: 1 - Kanad Basu, Shreyas Sen:
Special session on intelligent sensor nodes. VTS 2018: 1 - M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla:
Innovative practices on memory test practice. VTS 2018: 1 - Krishnendu Chakrabarty
, Li-C. Wang, Gaurav Veda, Yu Huang:
Special session on machine learning for test and diagnosis. VTS 2018: 1 - Young Gouk Cho, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
A coherent subsampling test system arrangement suitable for phase domain measurements. VTS 2018: 1-6 - Ro Cammarota, Naghmeh Karimi, Siddharth Garg, Jeyavijayan Rajendran:
Special session: Recent developments in hardware security. VTS 2018: 1 - Abhishek Das, Nur A. Touba:
Systematic b-adjacent symbol error correcting reed-solomon codes with parallel decoding. VTS 2018: 1-6 - Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick:
Innovative practices on quality levels of A/MS devices. VTS 2018: 1 - Rana Elnaggar, Ramesh Karri
, Krishnendu Chakrabarty
:
Securing IJTAG against data-integrity attacks. VTS 2018: 1-6 - Saurabh Gupta, Jae Wu, Jennifer Dworak:
Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG. VTS 2018: 1-6 - Omar Al-Terkawi Hasib, Daniel Crepeau, Thomas Awad, Andrei Dulipovici, Yvon Savaria, Claude Thibeault:
Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits. VTS 2018: 1-6 - Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
On-line monitoring and error correction in sensor interface circuits using digital calibration techniques. VTS 2018: 1-6 - Tamzidul Hoque, Xinmu Wang, Abhishek Basak, Robert Karam, Swarup Bhunia
:
Hardware Trojan attacks in embedded memory. VTS 2018: 1-6 - Michael S. Hsiao, Sarmad Tanwir:
Fast fault coverage estimation of sequential tests using entropy measurements. VTS 2018: 1-6 - Tsung-Ching Jim Huang, Jason Marsh, Scott H. Goodwin, Dorota S. Temple:
Innovative practices on design & test for flexible hybrid electronics. VTS 2018: 1 - Fatih Karabacak, Richard Welker, Matthew J. Casto, Jennifer N. Kitchen, Sule Ozev:
RF circuit authentication for detection of process Trojans. VTS 2018: 1-6 - Mohammad Nasim Imtiaz Khan, Swaroop Ghosh:
Test challenges and solutions for emerging non-volatile memories. VTS 2018: 1-6 - Qutaiba Khasawneh, Jennifer Dworak, Ping Gui, Benjamin Williams, Alan C. Elliott, Anand Muthaiah:
Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment. VTS 2018: 1-6 - Abhishek Koneru, Krishnendu Chakrabarty
:
An inter-layer interconnect BIST solution for monolithic 3D ICs. VTS 2018: 1-6 - Anandh Krishnan, John van Gelder, Mayukh Bhattacharya, Sreejit Chakravarty, Prashant Goteti:
Innovative practices on functional testing and fault simulation for FuSa. VTS 2018: 1 - Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev:
Online information utility assessment for per-device adaptive test flow. VTS 2018: 1-6 - Fang Lin, Ali Ahmadi, Kannan Sekar, Yan Pan, Ke Huang:
IC layout weak point effectiveness evaluation based on statistical methods. VTS 2018: 1-6 - Shih-Yao Lin, Yen-Chun Fang, Yu-Ching Li, Yu-Cheng Liu, Tsung-Shan Yang, Shang-Chien Lin, Chien-Mo James Li, Eric Jia-Wei Fang:
IR drop prediction of ECO-revised circuits using machine learning. VTS 2018: 1-6 - Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer:
Staggered ATPG with capture-per-cycle observation test points. VTS 2018: 1-6 - Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang:
Innovative practices on machine learning for emerging applications. VTS 2018: 1 - Terrence S. T. Mak, Hiroki Matsutani, Partha Pratim Pande:
Special session on bringing cores closer together: The wireless revolution in on-chip communication. VTS 2018: 1 - Yiorgos Makris
, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner:
Special session on machine learning: How will machine learning transform test? VTS 2018: 1 - Marc Margalef-Rovira, Manuel J. Barragán, Ekta Sharma, Philippe Ferrari, Emmanuel Pistono, Sylvain Bourdel:
An oscillation-based test technique for on-chip testing of mm-wave phase shifters. VTS 2018: 1-6 - Roy Meade, Woosung Kim, Richard Otte, Eugene R. Atwood:
Innovative practices on silicon photonics. VTS 2018: 1
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