"Exploiting built-in delay lines for applying launch-on-capture at-speed ..."

Omar Al-Terkawi Hasib et al. (2018)

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DOI: 10.1109/VTS.2018.8368637

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Omar Al-Terkawi Hasib, Daniel Crepeau, Thomas Awad, Andrei Dulipovici, Yvon Savaria, Claude Thibeault:
Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits. VTS 2018: 1-6

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