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Publication search results
found 19 matches
- 2006
- Hassan Al-Sukhni, David Lindberg, James Holt, Michele Reese:
Workload Slicing for Characterizing New Features in High Performance Microprocessors. MTV 2006: 61-67 - Tamarah Arons, Elad Elster, Terry Murphy, Eli Singerman:
Embedded Software Validation: Applying Formal Techniques for Coverage and Test Generation. MTV 2006: 45-51 - Noah Bamford, Rekha Bangalore, Eric Chapman, Hector Chavez, Rajeev Dasari, Yinfang Lin, Edgar Jimenez:
Challenges in System on Chip Verification. MTV 2006: 52-60 - Paolo Bernardi
, Letícia Maria Veiras Bolzani, Alberto Manzone, Massimo Osella, Massimo Violante, Matteo Sonza Reorda
:
Software-Based On-Line Test of Communication Peripherals in Processor-Based Systems for Automotive Applications. MTV 2006: 3-8 - Jorge Campos, Hussain Al-Asaad:
Circuit Profiling Mechanisms for High-Level {ATPG}. MTV 2006: 9-14 - Vijay Gangaram, Deepa Bhan, James K. Caldwell:
Functional Test Selection for High Volume Manufacturing. MTV 2006: 15-19 - Marc Herbstritt
, Bernd Becker
, Christoph Scholl:
Advanced SAT-Techniques for Bounded Model Checking of Blackbox Designs. MTV 2006: 37-44 - Hyun Sung Kim, D. M. H. Walker:
Statistical Static Timing Analysis Considering the Impact of Power Supply Noise in {VLSI} Circuits. MTV 2006: 76-82 - Heon-Mo Koo, Prabhat Mishra
, Jayanta Bhadra, Magdy S. Abadir:
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study. MTV 2006: 33-36 - Hiren D. Patel, Sandeep K. Shukla:
Deep vs. Shallow, Kernel vs. Language--What is Better for Heterogeneous Modeling in {SystemC}?. MTV 2006: 68-75 - Sean Safarpour, Andreas G. Veneris:
Abstraction and Refinement Techniques in Automated Design Debugging. MTV 2006: 88-93 - József Sziray:
Test Calculation for Logic and Delay Faults in Digital Circuits. MTV 2006: 20-32 - Preface. MTV 2006
- Acknowledgement. MTV 2006
- Workshop Organizing Committee. MTV 2006
- Program Committee. MTV 2006
- Chia-Chih Yen, Ten Lin, Hermes Lin, Kai Yang, Ta-Yung Liu, Yu-Chin Hsu:
Diagnosing Silicon Failures Based on Functional Test Patterns. MTV 2006: 94-98 - Jianmin Zhang, Ming Yan, Sikun Li:
Debug Support for Scalable System-on-Chip. MTV 2006: 83-87 - Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra:
Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA. IEEE Computer Society 2006, ISBN 978-0-7695-2839-7 [contents]
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