- D. Leet, P. Shearon, R. France:
A CMOS LSSD Test Generation System. IBM J. Res. Dev. 28(5): 625-635 (1984) - Marvin R. Libson, Harold E. Harvey:
A General-Purpose Memory Reliability Simulator. IBM J. Res. Dev. 28(2): 196-205 (1984) - Ralph Linsker:
An Iterative-Improvement Penalty-Function-Driven Wire Routing System. IBM J. Res. Dev. 28(5): 613-624 (1984) - Leon I. Maissel, Hillel Ofek:
Hardware Design and Description Languages in IBM. IBM J. Res. Dev. 28(5): 557-563 (1984) - Richard E. Matick, Daniel T. Ling, Satish Gupta, Frederick Dill:
All Points Addressable Raster Display Memory. IBM J. Res. Dev. 28(4): 379-392 (1984) - Mitsuru Ohba:
Software Reliability Analysis Models. IBM J. Res. Dev. 28(4): 428-443 (1984) - Donald L. Orth:
Empty Arrays in Extended APL. IBM J. Res. Dev. 28(4): 412-427 (1984) - Daniel L. Ostapko:
A Mapping and Memory Chip Hardware which Provides Symmetric Reading/Writing of Horizontal and Vertical Lines. IBM J. Res. Dev. 28(4): 393-398 (1984) - Frederic N. Ris:
Experience with Access Functions in an Experimental Compiler. IBM J. Res. Dev. 28(1): 40-51 (1984) - John F. Sowa:
Interactive Language Implementation System. IBM J. Res. Dev. 28(1): 28-39 (1984) - Charles H. Stapper:
Modeling of Defects in Integrated Circuit Photolithographic Patterns. IBM J. Res. Dev. 28(4): 461-475 (1984) - Charles H. Stapper:
Yield Model for Fault Clusters Within Integrated Circuits. IBM J. Res. Dev. 28(5): 636-640 (1984) - Robert Strom, Nagui Halim:
A New Programming Methodology for Long-Lived Software Systems. IBM J. Res. Dev. 28(1): 52-59 (1984) - Donald T. Tang, C. L. Chen:
Iterative Exhaustive Pattern Generation for Logic Testing. IBM J. Res. Dev. 28(2): 212-219 (1984) - Richard L. Taylor:
A Software Architecture for a Mature Design Automation System. IBM J. Res. Dev. 28(5): 501-512 (1984) - David R. Tryon, Fred M. Armstrong, Mark R. Reiter:
Statistical Failure Analysis of System Timing. IBM J. Res. Dev. 28(4): 340-355 (1984)
