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"Yield Model for Fault Clusters Within Integrated Circuits."

Charles H. Stapper (1984)

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DOI: 10.1147/RD.285.0636

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/ibmrd/Stapper84a
Charles H. Stapper:
Yield Model for Fault Clusters Within Integrated Circuits. IBM J. Res. Dev. 28(5): 636-640 (1984)

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