- Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng
:
Functionally Testable Path Delay Faults on a Microprocessor. IEEE Des. Test Comput. 17(4): 6-14 (2000) - Chien-Nan Jimmy Liu, Jing-Yang Jou:
An Automatic Controller Extractor for HDL Descriptions at the RTL. IEEE Des. Test Comput. 17(3): 72-77 (2000) - Sergio López-Buedo
, Javier Garrido Salas
, Eduardo I. Boemo
:
Thermal Testing on Reconfigurable Computers. IEEE Des. Test Comput. 17(1): 84-91 (2000) - Subhasish Mitra
, LaNae J. Avra, Edward J. McCluskey:
Efficient Multiplexer Synthesis Techniques. IEEE Des. Test Comput. 17(4): 90-97 (2000) - Mukund Modi:
TTTC Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(1): 100-101 (2000) - Mukund Modi:
SCC20 Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(2): 142-143 (2000) - Mukund Modi:
TTTC Reports on Recent Standards Activities. IEEE Des. Test Comput. 17(3): 136-137 (2000) - Daler N. Rakhmatov, Sarma B. K. Vrudhula, Thomas J. Brown, Ajay Nagarandal:
Adaptive Multiuser Online Reconfigurable Engine. IEEE Des. Test Comput. 17(1): 53-67 (2000) - Hemant G. Rotithor:
Postsilicon Validation Methodology for Microprocessors. IEEE Des. Test Comput. 17(4): 77-88 (2000) - Janardhan H. Satyanarayana, Keshab K. Parhi
:
Power Estimation of Digital Data Paths Using HEAT. IEEE Des. Test Comput. 17(2): 101-110 (2000) - Nirmal R. Saxena, Santiago Fernández-Gomez, Wei-Je Huang, Subhasish Mitra
, Shu-Yi Yu, Edward J. McCluskey:
Dependable Computing and Online Testing in Adaptive and Configurable Systems. IEEE Des. Test Comput. 17(1): 29-41 (2000) - Donatella Sciuto:
Guest Editor's Introduction: Design Tools for Embedded Systems. IEEE Des. Test Comput. 17(2): 11-13 (2000) - Marco Sgroi, Luciano Lavagno, Alberto L. Sangiovanni-Vincentelli
:
Formal Models for Embedded System Design. IEEE Des. Test Comput. 17(2): 14-27 (2000) - Frank Slomka, Matthias Dörfel, Ralf Münzenberger, Richard Hofmann:
Hardware/Software Codesign and Rapid Prototyping of Embedded Systems. IEEE Des. Test Comput. 17(2): 28-38 (2000) - Hendrawan Soeleman, Kaushik Roy, Tan-Li Chou:
Estimating Circuit Activity in Combinational CMOS Digital Circuits. IEEE Des. Test Comput. 17(2): 112-119 (2000) - Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen:
Effectiveness of Microarchitecture Test Program Generation. IEEE Des. Test Comput. 17(4): 38-49 (2000) - Pramodchandran N. Variyam, Abhijit Chatterjee:
Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. IEEE Des. Test Comput. 17(3): 106-115 (2000) - News. IEEE Des. Test Comput. 17(1): 4-6 (2000)
- Hardware-Software Codesign. IEEE Des. Test Comput. 17(1): 92-99 (2000)
- Panel Summaries. IEEE Des. Test Comput. 17(1): 102-105 (2000)
- Conference Reports. IEEE Des. Test Comput. 17(1): 106-107 (2000)
- TTTC Newsletter. IEEE Des. Test Comput. 17(1): 108-109 (2000)
- DATC Newsletter. IEEE Des. Test Comput. 17(1): 110- (2000)
- News. IEEE Des. Test Comput. 17(2): 6-9 (2000)
- A D&T Roundtable: Design Automation in a Subwavelength Worl. IEEE Des. Test Comput. 17(2): 120-126 (2000)
- Conference Reports. IEEE Des. Test Comput. 17(2): 127-135 (2000)
- Panel Summaries. IEEE Des. Test Comput. 17(2): 136-139 (2000)
- DATC Newsletter. IEEE Des. Test Comput. 17(2): 140- (2000)
- TTTC Newsletter. IEEE Des. Test Comput. 17(2): 141- (2000)
- In the Licensing Dungeon: CAD by the Minute. IEEE Des. Test Comput. 17(2): 143-144 (2000)