"Effectiveness of Microarchitecture Test Program Generation."

Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen (2000)

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DOI: 10.1109/54.895005

access: closed

type: Journal Article

metadata version: 2020-05-17

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Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen:
Effectiveness of Microarchitecture Test Program Generation. IEEE Des. Test Comput. 17(4): 38-49 (2000)

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