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"Functionally Testable Path Delay Faults on a Microprocessor."

Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng (2000)

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DOI: 10.1109/54.895002

access: closed

type: Journal Article

metadata version: 2022-12-07

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  dblp key:
  - journals/dt/LaiKC00
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  persistent URL:
  - https://dblp.org/rec/journals/dt/LaiKC00
Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng:
Functionally Testable Path Delay Faults on a Microprocessor. IEEE Des. Test Comput. 17(4): 6-14 (2000)

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