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Katsuyoshi Miura , Koji Nakamae , Hiromu Fujioka : Intelligent EB Test System for Automatic VLSI Fault Tracing. Asian Test Symposium 1999 : 335-341 share record
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Kiyoshi Nikawa , Shoji Inoue , Kazuyuki Morimoto , Shinya Sone : Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium 1999 : 383-388 share record
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Kiyoshi Nikawa , Shoji Inoue , Kazuyuki Morimoto , Shinya Sone : Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. Asian Test Symposium 1999 : 394- share record
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Satoshi Ohtake , Michiko Inoue , Hideo Fujiwara : A Method of Test Generation for Weakly Testable Data Paths Using Test Knowledge Extracted from RTL Description. Asian Test Symposium 1999 : 5-12 share record
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Chenglian Peng , Baifeng Wu , Xiaoguang Sun : Test by Distributed Monitoring. Asian Test Symposium 1999 : 218- share record
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Irith Pomeranz , Sudhakar M. Reddy : Vector-Based Functional Fault Models for Delay Faults. Asian Test Symposium 1999 : 41-46 share record
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Irith Pomeranz , Sudhakar M. Reddy : Pattern Sensitivity: A Property to Guide Test Generation for Combinational Circuits. Asian Test Symposium 1999 : 75-80 share record
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C. P. Ravikumar , Ashutosh Verma , Gaurav Chandra : A Polynomial-Time Algorithm for Power Constrained Testing of Core Based Systems. Asian Test Symposium 1999 : 107-112 share record
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Michel Renovell , Jean-Michel Portal , Joan Figueras , Yervant Zorian : Minimizing the Number of Test Configurations for Different FPGA Families. Asian Test Symposium 1999 : 363-368 share record
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Takahide Sakata , Hideyuki Takahashi , Tetsu Sekine , Toshiya Ogiwara : Investigation of Ga Contamination Due to Analysis by Dual Beam FIB. Asian Test Symposium 1999 : 389-393 share record
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Li Shen : Genetic Algorithm Based Test Generation for Sequential Circuits. Asian Test Symposium 1999 : 179-184 share record
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Reisuke Shimoda , Takaki Yoshida , Masafumi Watari , Yasuhiro Toyota , Kiyokazu Nishi , Akira Motohara : Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. Asian Test Symposium 1999 : 347- share record
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Tsuyoshi Shinogi , Terumine Hayashi : A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. Asian Test Symposium 1999 : 164- export record
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G. Sidiropoulos , Haridimos T. Vergos , Dimitris Nikolos : Easily Path Delay Fault Testable Non-Restoring Cellular Array Dividers. Asian Test Symposium 1999 : 47-52 share record
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Albrecht P. Stroele , Frank Mayer : Test Scheduling with Loop Folding and Its Application to Test Configurations with Accumulators. Asian Test Symposium 1999 : 101-106 share record
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Chauchin Su , Yue-Tsang Chen , Chung-Len Lee : Analog Metrology and Stimulus Selection in a Noisy Environment. Asian Test Symposium 1999 : 233-238 share record
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Hiroshi Takahashi , Kwame Osei Boateng , Yuzo Takamatsu , Nobuhiro Yanagida : Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. Asian Test Symposium 1999 : 341-346 share record
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Tomoya Takasaki , Hideo Fujiwara , Tomoo Inoue : A High-Level Synthesis Approach to Partial Scan Design Based on Acyclic Structure. Asian Test Symposium 1999 : 309-314 share record
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Jing-Jou Tang : An Accurate Logic Threshold Voltages Determination Model for CMOS Gates to Facilitate Test Generation and Fault Simulation. Asian Test Symposium 1999 : 81- share record
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Yasuyuki Taniguchi , Naotake Kamiura , Yutaka Hata , Nobuyuki Matsui : Activation Function Manipulation for Fault Tolerant Feedforward Neural Networks. Asian Test Symposium 1999 : 203-208 share record
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Haiying Tu , Fangmei Wu : How to Design an Environment Simulator for Safety Critical Software Testing. Asian Test Symposium 1999 : 256- share record
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Fangmei Wu , Meng Li : Railway Signaling Safety-critical Software Testing Based on Dynamic Decision Table. Asian Test Symposium 1999 : 247-250 share record
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Shiyi Xu , Tukwasibwe Justaf Frank : An Evaluation of Test Generation Algorithms for combinational Circuits. Asian Test Symposium 1999 : 63-69 share record
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Zhongwei Xu , Fangmei Wu : A Novel Testing Approach for Safety-Critical Software. Asian Test Symposium 1999 : 251-255 share record
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Teruhiko Yamada , Toshinori Kotake , Hiroshi Takahashi , Koji Yamazaki : Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset. Asian Test Symposium 1999 : 269-274 share record
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Yinlei Yu , Jian Xu , Wei-Kang Huang , Fabrizio Lombardi : Minimizing the Number of Programming Steps for Diagnosis of Interconnect Faults in FPGAs. Asian Test Symposium 1999 : 357-362 share record
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Zhide Zeng , Jihua Chen , Hefeng Cao : Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. Asian Test Symposium 1999 : 70-74 share record
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Zhide Zeng , Jihua Chen , Pengxia Liu : A Fault Partitioning Method in Parallel Test Generation for Large Scale VLSI Circuits. Asian Test Symposium 1999 : 133- share record
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Tao Zhang , Dongcheng Hu , Shiyuan Yang : Fault-Tolerant Analysis of Feedback Neural Networks with Threshold Neurons. Asian Test Symposium 1999 : 209-213 share record
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Lan Zhao , D. M. H. Walker , Fabrizio Lombardi : IDDQ Testing of Input/Output Resources of SRAM-Based FPGAs. Asian Test Symposium 1999 : 375-