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"Research and Implementation of a High Speed Test Generation for Ultra ..."

Zhide Zeng, Jihua Chen, Hefeng Cao (1999)

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DOI: 10.1109/ATS.1999.810731

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zhide Zeng, Jihua Chen, Hefeng Cao:
Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits. Asian Test Symposium 1999: 70-74

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