"Fast Analytic Electromigration Analysis for General Multisegment ..."

Liang Chen et al. (2020)

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DOI: 10.1109/TVLSI.2019.2940197

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type: Journal Article

metadata version: 2023-12-19

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Liang Chen, Sheldon X.-D. Tan, Zeyu Sun, Shaoyi Peng, Min Tang, Junfa Mao:
Fast Analytic Electromigration Analysis for General Multisegment Interconnect Wires. IEEE Trans. Very Large Scale Integr. Syst. 28(2): 421-432 (2020)

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