"Functional Test Generation for Hard-to-Reach States Using Path Constraint ..."

Yanhong Zhou et al. (2016)

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DOI: 10.1109/TCAD.2015.2481863

access: closed

type: Journal Article

metadata version: 2023-05-11

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Yanhong Zhou, Tiancheng Wang, Huawei Li, Tao Lv, Xiaowei Li:
Functional Test Generation for Hard-to-Reach States Using Path Constraint Solving. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(6): 999-1011 (2016)

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