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"Logic BIST With Capture-Per-Clock Hybrid Test Points."

Elham K. Moghaddam et al. (2019)

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DOI: 10.1109/TCAD.2018.2834441

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/MoghaddamMRSTZ19
Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada:
Logic BIST With Capture-Per-Clock Hybrid Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(6): 1028-1041 (2019)

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