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"Physics-Based Electromigration Models and Full-Chip Assessment for Power ..."

Xin Huang et al. (2016)

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DOI: 10.1109/TCAD.2016.2524540

access: closed

type: Journal Article

metadata version: 2020-09-24

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Xin Huang, Armen Kteyan, Sheldon X.-D. Tan, Valeriy Sukharev:
Physics-Based Electromigration Models and Full-Chip Assessment for Power Grid Networks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(11): 1848-1861 (2016)

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