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"Analytical Modeling and Characterization of Electromigration Effects for ..."

Hai-Bao Chen et al. (2016)

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DOI: 10.1109/TCAD.2016.2523898

access: closed

type: Journal Article

metadata version: 2020-09-24

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Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Taeyoung Kim, Valeriy Sukharev:
Analytical Modeling and Characterization of Electromigration Effects for Multibranch Interconnect Trees. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(11): 1811-1824 (2016)

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