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"Accurate negative bias temperature instability lifetime prediction based ..."

Akinobu Teramoto et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.062

access: closed

type: Journal Article

metadata version: 2020-10-26

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Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi:
Accurate negative bias temperature instability lifetime prediction based on hole injection. Microelectron. Reliab. 48(10): 1649-1654 (2008)

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