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"On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs."

Mehdi Rzin et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.122

access: closed

type: Journal Article

metadata version: 2022-09-07

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  - journals/mr/RzinCSMHHSMSSGB18
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  - https://dblp.org/rec/journals/mr/RzinCSMHHSMSSGB18
Mehdi Rzin, Alessandro Chini, Carlo De Santi, Matteo Meneghini, A. Hugger, Marc Hollmer, H. Stieglauer, M. Madel, J. Splettstößer, Daniel Sommer, Jan Grünenpütt, K. Beilenhoff, Hervé Blanck, J.-T. Chen, O. Kordina, Gaudenzio Meneghesso, Enrico Zanoni:
On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs. Microelectron. Reliab. 88-90: 397-401 (2018)

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