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"Failure limits and electro-optical characteristics of GaN-based LEDs under ..."

N. Renso et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.054

access: closed

type: Journal Article

metadata version: 2023-06-26

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N. Renso, Matteo Buffolo, Carlo De Santi, M. Ronzani, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress. Microelectron. Reliab. 88-90: 887-890 (2018)

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