"A low-noise, process-variation-tolerant double-gate FinFET based sense ..."

Surendra S. Rathod, Ashok K. Saxena, Sudeb Dasgupta (2011)

Details and statistics

DOI: 10.1016/J.MICROREL.2010.11.006

access: closed

type: Journal Article

metadata version: 2023-09-30

a service of  Schloss Dagstuhl - Leibniz Center for Informatics