"Determination of GaN HEMT reliability by monitoring I_DSS."

Reza Pazirandeh, Joachim Würfl, Günther Tränkle (2010)

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DOI: 10.1016/J.MICROREL.2010.02.017

access: closed

type: Journal Article

metadata version: 2020-02-22

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Reza Pazirandeh, Joachim Würfl, Günther Tränkle:
Determination of GaN HEMT reliability by monitoring I_DSS. Microelectron. Reliab. 50(6): 763-766 (2010)

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