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"A novel approach to characterization of progressive breakdown in ..."
R. Pagano et al. (2008)
- R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young
, Rino Choi
, Gennadi Bersuker, James H. Stathis
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A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. Microelectron. Reliab. 48(11-12): 1759-1764 (2008)
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