"Reliability evaluation for Blu-Ray laser diodes."

Matteo Meneghini et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.01.034

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type: Journal Article

metadata version: 2024-05-07

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Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso:
Reliability evaluation for Blu-Ray laser diodes. Microelectron. Reliab. 50(4): 467-470 (2010)

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