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"Temperature dependence of the interface state distribution due to hot ..."

Chenyue Ma et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.04.017

access: closed

type: Journal Article

metadata version: 2023-09-01

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Chenyue Ma, Hao Wang, Chenfei Zhang, Xiufang Zhang, Jin He, Xing Zhang:
Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device. Microelectron. Reliab. 50(8): 1077-1080 (2010)

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