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"An active heat-based restoring mechanism for improving the reliability of ..."

Jacopo Iannacci et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jacopo Iannacci, Alessandro Faes, A. Repchankova, Augusto Tazzoli, Gaudenzio Meneghesso:
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches. Microelectron. Reliab. 51(9-11): 1869-1873 (2011)

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