"Degradation of GaN-on-GaN vertical diodes submitted to high current stress."

Eric E. Fabris et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.041

access: open

type: Journal Article

metadata version: 2024-05-07

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Eric E. Fabris, Matteo Meneghini, Carlo De Santi, Zongyang Hu, Wenshen Li, Kazuki Nomoto, Debdeep Jena, Huili Grace Xing, Xiang Gao, Gaudenzio Meneghesso, Enrico Zanoni:
Degradation of GaN-on-GaN vertical diodes submitted to high current stress. Microelectron. Reliab. 88-90: 568-571 (2018)

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