Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Ultra wide voltage range consideration of reliability-aware STT magnetic ..."

Hao Cai et al. (2015)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2015.06.023

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/CaiWNZ15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/CaiWNZ15
Hao Cai, You Wang, Lirida A. B. Naviner, W. S. Zhao:
Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology. Microelectron. Reliab. 55(9-10): 1323-1327 (2015)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.