"Exploring ICMetrics to detect abnormal program behaviour on embedded devices."

Xiaojun Zhai et al. (2015)

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DOI: 10.1016/J.SYSARC.2015.07.007

access: closed

type: Journal Article

metadata version: 2022-07-15

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Xiaojun Zhai, Kofi Appiah, Shoaib Ehsan, Gareth Howells, Huosheng Hu, Dongbing Gu, Klaus D. McDonald-Maier:
Exploring ICMetrics to detect abnormal program behaviour on embedded devices. J. Syst. Archit. 61(10): 567-575 (2015)

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