"Diagnostic Test Generation for Transition Delay Faults Using Stuck-At ..."

Yu Zhang, Bei Zhang, Vishwani D. Agrawal (2014)

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DOI: 10.1007/S10836-014-5490-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yu Zhang, Bei Zhang, Vishwani D. Agrawal:
Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools. J. Electron. Test. 30(6): 763-780 (2014)

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