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"Detecting NBTI induced failures in SRAM core-cells."

Renan Alves Fonseca et al. (2010)

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DOI: 10.1109/VTS.2010.5469612

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  dblp key:
  - conf/vts/FonsecaDBGPVB10
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  - https://dblp.org/rec/conf/vts/FonsecaDBGPVB10
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Detecting NBTI induced failures in SRAM core-cells. VTS 2010: 75-80

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