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"Threshold voltage shift and interface/border trapping mechanism in ..."

Jie-Jie Zhu et al. (2018)

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DOI: 10.1109/IRPS.2018.8353704

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-17

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  dblp key:
  - conf/irps/ZhuHCZYZZMH18
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  - https://dblp.org/rec/conf/irps/ZhuHCZYZZMH18
Jie-Jie Zhu, Bin Hou, Lixiang Chen, Qing Zhu, Ling Yang, Xiaowei Zhou, Peng Zhang, Xiaohua Ma, Yue Hao:
Threshold voltage shift and interface/border trapping mechanism in Al2O3/AlGaN/GaN MOS-HEMTs. IRPS 2018: 1

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