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"Elapsed-time statistics of successive breakdown in the presence of ..."

Ernest Y. Wu et al. (2018)

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DOI: 10.1109/IRPS.2018.8353553

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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Ernest Y. Wu, Andrew Kim, Baozhen Li, James H. Stathis:
Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications. IRPS 2018: 3

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