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"Reliability assessment of hafnia-based ferroelectric devices and arrays ..."

Laurent Grenouillet et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118099

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-18

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  dblp key:
  - conf/irps/GrenouilletBLMCLBMKBMJAC23
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  persistent URL:
  - https://dblp.org/rec/conf/irps/GrenouilletBLMCLBMKBMJAC23
Laurent Grenouillet, Justine Barbot, J. Laguerre, Simon Martin, Catherine Carabasse, M. Louro, Messaoud Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, Thomas Magis, Carine Jahan, François Andrieu, Jean Coignus:
Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited). IRPS 2023: 1-8

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