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"Analysis of the impact of random process variations in CMOS tapered buffers."

Massimo Alioto, Gaetano Palumbo, Melita Pennisi (2009)

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DOI: 10.1109/ICECS.2009.5410918

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  - conf/icecsys/AliotoPP09
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Massimo Alioto, Gaetano Palumbo, Melita Pennisi:
Analysis of the impact of random process variations in CMOS tapered buffers. ICECS 2009: 57-60

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