"MuTaTe: an efficient design for testability technique for multiplexor ..."

Rolf Drechsler, Junhao Shi, Görschwin Fey (2003)

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DOI: 10.1145/764808.764830

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Rolf Drechsler, Junhao Shi, Görschwin Fey:
MuTaTe: an efficient design for testability technique for multiplexor based circuits. ACM Great Lakes Symposium on VLSI 2003: 80-83

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