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"Analysis of resistive-bridging defects in SRAM core-cells: A comparative ..."
Renan Alves Fonseca et al. (2010)
- Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. ETS 2010: 132-137
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