"Design for manufacturability and reliability for TSV-based 3D ICs."

David Z. Pan et al. (2012)

Details and statistics

DOI: 10.1109/ASPDAC.2012.6165055

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

a service of  Schloss Dagstuhl - Leibniz Center for Informatics