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Wolfgang Vermeiren
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Books and Theses
- 1987
- [b1]Wolfgang Vermeiren:
Zur Zustandsermittlung bei ausgewählten landwirtschaftlichen und wasserwirtschaftlichen Prozessen. Dresden University of Technology, Germany, 1987
Journal Articles
- 2011
- [j1]Fabian Hopsch, Bernd Becker
, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Variation-aware fault modeling. Sci. China Inf. Sci. 54(9): 1813-1826 (2011)
Conference and Workshop Papers
- 2011
- [c10]Fabian Hopsch, Michael Lindig, Bernd Straube, Wolfgang Vermeiren:
Characterization of digital cells for statistical test. DDECS 2011: 255-260 - 2010
- [c9]Matthias Gulbins, Fabian Hopsch, Peter Schneider
, Bernd Straube, Wolfgang Vermeiren:
Developing digital test sequences for through-silicon vias within 3D structures. 3DIC 2010: 1-6 - [c8]Fabian Hopsch, Bernd Becker
, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Variation-Aware Fault Modeling. Asian Test Symposium 2010: 87-93 - [c7]Bernd Becker
, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. DSN Workshops 2010: 95-100 - 2006
- [c6]René Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube:
Embedded Self Repair by Transistor and Gate Level Reconfiguration. DDECS 2006: 210-215 - 2000
- [c5]Jürgen Haase, Peter Schwarz, Peter Trappe, Wolfgang Vermeiren:
Erfahrungen mit VHDL-AMS bei der Simulation heterogener Systeme. MBMV 2000: 167-175 - 1999
- [c4]Bernd Straube, Kurt Reinschke, Wolfgang Vermeiren, Klaus Röbenack
, Bert Müller, Christoph Clauß:
On the fault-injection-caused increase of the DAE-index in analogue fault simulation. ETW 1999: 118-122 - 1996
- [c3]Wolfgang Vermeiren, Bernd Straube, Andreas Holubek:
Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components. ED&TC 1996: 522-527 - 1994
- [c2]Wolfgang Vermeiren, Bernd Straube, Günter Elst:
A Suggestion for Accelerating the Analog Fault Simulation. EDAC-ETC-EUROASIC 1994: 662 - 1993
- [c1]Wolfgang Vermeiren, Wolfgang Straube, Günter Elst:
Improvement of analog circuit fault detectability using fault detection observers. VTS 1993: 218-224
Coauthor Index
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