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"Massive statistical process variations: A grand challenge for testing ..."

Bernd Becker et al. (2010)

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DOI: 10.1109/DSNW.2010.5542612

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich:
Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. DSN Workshops 2010: 95-100

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