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Mikaël Deobarro

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Journal Articles

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2012
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Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28(3): 339-348 (2012)
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Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh:
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Trans. Instrum. Meas. 61(3): 696-707 (2012)

Conference and Workshop Papers

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2011
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Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC immunity modeling process validation using on-chip measurements. LATW 2011: 1-6

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