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Hitoshi Aoki
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Journal Articles
- 2017
- [j4]Toshiko Tominaga, Kanako Sato, Noriko Yoshimura, Masataka Masuda, Hitoshi Aoki, Takanori Hayashi:
Web-Browsing QoE Estimation Model. IEICE Trans. Commun. 100-B(10): 1837-1845 (2017) - 2014
- [j3]Haruo Kobayashi, Hitoshi Aoki, Kentaroh Katoh, Congbing Li:
Analog/mixed-signal circuit design in nano CMOS era. IEICE Electron. Express 11(3): 20142001 (2014) - 2010
- [j2]Son Dao Vu Truong, Takeharu Goji Etoh, Masatoshi Tanaka, Dung H. Nguyen, Cuong Vo Le, Kohsei Takehara, Toshiro Akino, Kenji Nishi, Hitoshi Aoki, Junichi Nakai:
Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor. Sensors 10(1): 16-35 (2010) - 2008
- [j1]Noritsugu Egi, Hitoshi Aoki, Akira Takahashi:
Objective Quality Evaluation Method for Noise-Reduced Speech. IEICE Trans. Commun. 91-B(5): 1279-1286 (2008)
Conference and Workshop Papers
- 2021
- [c9]Hitoshi Aoki, Hiroyuki Sakairi, Naotaka Kuroda, Atsushi Yamaguchi, Ken Nakahara:
Geometry Independent Hole Injection Current Model of GaN Ridge HEMTs. ISIE 2021: 1-6 - 2019
- [c8]Hitoshi Aoki, Hiroyuki Sakairi, Naotaka Kuroda, Kentaro Chikamatsu, Ken Nakahara:
Switching Time Characterization and Modeling of AlN/GaN MIS-HEMTs. ICIT 2019: 550-555 - [c7]Sebastian Möller, Gabriel Mittag, Thilo Michael, Vincent Barriac, Hitoshi Aoki:
Extending the E-Model Towards Super-Wideband and Fullband Speech Communication Scenarios. INTERSPEECH 2019: 3436-3440 - 2017
- [c6]Haruo Kobayashi, Isao Shimizu, Nobukazu Tsukiji, Miho Arai, Kazuyoshi Kubo, Hitoshi Aoki:
Fundamental design tradeoff and performance limitation of electronic circuits based on uncertainty relationships. ASICON 2017: 549-552 - 2016
- [c5]Daisuke Matsuura, Hitoshi Aoki, Yukio Takeda:
Development of a 3D-magnetic tweezer system having magnetic pole positioning mechanism. ICRA 2016: 1745-1750 - 2015
- [c4]Masashi Higashino, Hitoshi Aoki, Nobukazu Tsukiji, Masaki Kazumi, Takuya Totsuka, Haruo Kobayashi:
Study on maximum electric field modeling used for HCI induced degradation characteristic of LDMOS transistors. ASICON 2015: 1-4 - [c3]Nobukazu Tsukiji, Hitoshi Aoki, Masaki Kazumi, Takuya Totsuka, Masashi Higashino, Haruo Kobayashi:
A study on HCI induced gate leakage current model used for reliability simulations in 90nm n-MOSFETs. ASICON 2015: 1-4 - 2006
- [c2]Hitoshi Aoki, Atsuko Kurashima, Akira Takahashi:
Conversational quality estimation model for wideband IP-telephony services. INTERSPEECH 2006 - 2005
- [c1]Hitoshi Aoki, Akira Takahashi:
Analysis of Relationship Betweeen Overall Quality and Psychological Factors Affecting High-Quality Speech Communication Services. ICASSP (1) 2005: 57-60
Coauthor Index
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