default search action

combined dblp search
author search
venue search
publication search

ask others

C. C. Beh

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

1980 – 1989

see FAQ

What is the meaning of the colors in the publication lists?

1984
[c2]
- no documents available
  - no references & citations available
- export record
  dblp key:
  - conf/itc/WuRB84
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/WuRB84
David M. Wu, Charles E. Radke, C. C. Beh:
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717
1982
[c1]
- no documents available
  - no references & citations available
- export record
  dblp key:
  - conf/itc/BehARV82
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BehARV82
C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku:
Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.