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C. C. Beh

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Conference and Workshop Papers

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1984
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  dblp key:
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David M. Wu, Charles E. Radke, C. C. Beh:
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717
1982
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C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku:
Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42

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