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Jon C. Lee

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affiliation: Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, Taiwan

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Journal Articles

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2009
[j4]
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Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee:
A study of electrical characteristic changes in MOSFET by electron beam irradiation. Microelectron. Reliab. 49(9-11): 1182-1187 (2009)
2003
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Jon C. Lee, J. H. Chuang:
A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis. Microelectron. Reliab. 43(9-11): 1687-1692 (2003)
2002
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Jon C. Lee, C. H. Chen, David Su, J. H. Chuang:
Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation. Microelectron. Reliab. 42(9-11): 1707-1710 (2002)
2001
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Jon C. Lee, David Su, J. H. Chuang:
A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis. Microelectron. Reliab. 41(9-10): 1551-1556 (2001)

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