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B. Raeissi

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Journal Articles

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2007
[j1]
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  dblp key:
  - journals/mr/BuiuHERLHC07
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  persistent URL:
  - https://dblp.org/rec/journals/mr/BuiuHERLHC07
Octavian Buiu, Steve Hall, Olof Engström, B. Raeissi, Max Christian Lemme, Paul K. Hurley, Karim Cherkaoui:
Extracting the relative dielectric constant for "high-kappa layers" from CV measurements - Errors and error propagation. Microelectron. Reliab. 47(4-5): 678-681 (2007)

Conference and Workshop Papers

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2021
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  - conf/whispers/GarrettJOBR21
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  - https://dblp.org/rec/conf/whispers/GarrettJOBR21
Joseph L. Garrett, Tor Arne Johansen, Milica Orlandic, M. A. Bashir, B. Raeissi:
Detecting Pinholes in Coatings with Hyperspectral Imaging. WHISPERS 2021: 1-5

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